hologenix.com

HOLOGENIX A Diversified International Technology Company

Skip to main content. NGS - Automated Defect Detection, Classification, and Metrology System. COREMA - WT System. YIS-HM SlipFinder - Crystal Slip Defect Detection. Pulse Solar Simulator for PV Modules. NGS - Automated Defect Detection, Classification, and Metrology System. Automatic Defect Detection and Classification. Wafer Geometry and Resistivity. MX6012-DRAT-8C 300mm Wafer Sorter. COREMA - WT System. Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,.
history traffic contact

OVERVIEW

The website hologenix.com currently has a traffic classification of zero (the lower the better). We have examined zero pages inside the site hologenix.com and found twelve websites referencing hologenix.com. I found one contacts and directions for hologenix.com to help you contact them. The website hologenix.com has been on the internet for one thousand three hundred and ninety-nine weeks, twenty-two days, fourteen hours, and fifty-two minutes.
Links to this site
12
Contacts
1
Addresses
1
Online Since
Sep 1997

HOLOGENIX.COM TRAFFIC

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HOLOGENIX.COM HISTORY

The website hologenix.com was created on September 15, 1997. This web site will expire on September 13, 2014. It is now one thousand three hundred and ninety-nine weeks, twenty-two days, fourteen hours, and fifty-two minutes young.
REGISTERED
September
1997
EXPIRED
September
2014

COMPANY AGE

26
YEARS
9
MONTHS
23
DAYS

LINKS TO DOMAIN

Boin GmbH - Wafermap Metrology Software, Solutions for OEMs

Metrology software for the semiconductor industry. Download the evaluation copy of WAFERMAP or PANELMAP. Read, analyze and visualize data files from semiconductor metrology equipment. Metrology software for the semiconductor industry. Download the evaluation copy of WAFERMAP or PANELMAP. Read, analyze and visualize data files from semiconductor metrology equipment.

Semiconductor Manufacturing - Main Index

Your Guide to Semiconductor Manufacturing on the Web. September 30 -October 2, 2009, Taipei World Trade Center, Taiwan. October 6-8, 2009, Messe Dresden Germany. December 2 December 4, 2009, Makuhari Messe, Chiba, Japan. June 14 -16, 2010, World Trade Center, Moscow, Russia. History of Semiconductors, Industry Organizations, Conferences, Manufacturing of Solid State Devices, Semiconductor News, The Diode, The Transistor. Basic operations of wafer .

Semimap COREMA Contactless Resistivity Mapping for GaAs and SiC

SemiMap Scientific Instruments GmbH develops measurement systems to evaluate electrical properties of semi-insulating compound semiconductor substrates. GaAs, InP, SiC, GaN and CdTe. Are chearacterized by SemiMap systems with respect to resistivity, mobility and carrier concentration.

WHAT DOES HOLOGENIX.COM LOOK LIKE?

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CONTACTS

5932 Bolsa Avenue

Phillip Blaustein

Suite 104

Huntington Beach, California, 92649

United States

1.7149035999
pblaustein@hologenix.com

HOLOGENIX.COM SERVER

I detected that the main root page on hologenix.com took one thousand nine hundred and two milliseconds to load. I could not discover a SSL certificate, so I consider hologenix.com not secure.
Load time
1.902 secs
SSL
NOT SECURE
Internet Protocol
107.180.2.242

NAME SERVERS

ns35.domaincontrol.com
ns36.domaincontrol.com

BROWSER IMAGE

SERVER OS AND ENCODING

We diagnosed that this website is implementing the Apache os.

HTML TITLE

HOLOGENIX A Diversified International Technology Company

DESCRIPTION

Skip to main content. NGS - Automated Defect Detection, Classification, and Metrology System. COREMA - WT System. YIS-HM SlipFinder - Crystal Slip Defect Detection. Pulse Solar Simulator for PV Modules. NGS - Automated Defect Detection, Classification, and Metrology System. Automatic Defect Detection and Classification. Wafer Geometry and Resistivity. MX6012-DRAT-8C 300mm Wafer Sorter. COREMA - WT System. Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,.

PARSED CONTENT

The website hologenix.com states the following, "NGS - Automated Defect Detection, Classification, and Metrology System." We viewed that the website stated " YIS-HM SlipFinder - Crystal Slip Defect Detection." It also said " Pulse Solar Simulator for PV Modules. NGS - Automated Defect Detection, Classification, and Metrology System. Automatic Defect Detection and Classification. Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,."

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